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Accueil > Séminaires > Séminaires passés > Seminaires de 2014 > Ion Beam Analysis at Porto Alegre (RS, Brazil) : current trends and perspectives

Johnny Ferraz Dias (Laboratório de Implantação Iônica, UFRGS, Porto Alegre, Brasil)

Ion Beam Analysis at Porto Alegre (RS, Brazil) : current trends and perspectives

Mardi 21 janvier , 15h30, CSNSM Salle de réunion du Bât 108

The Ion Implantation Laboratory of the Physics Institute of the Federal University of Rio Grande do Sul (Porto Alegre, RS, Brazil) has been active for over 30 years in the field of modification and analysis of materials using energetic ions. Several techniques like Nuclear Reaction Analysis (NRA), Rutherford Backscattering Spectrometry (RBS), Particle-Induced X-ray Emission (PIXE) and Medium Energy Ion Scattering (MEIS) provide a broad range of materials analysis. In this talk a brief description of these techniques will be given. In particular, the capabilities of PIXE and microprobe techniques will be discussed.

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